Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces

Description for Scanning Force Microscopy With Applications to Electric Magnetic and Atomic Forces

Dror Sarid, "Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford Series in Optical and Imaging Sciences)"
Publisher: Oxford University Press, USA | 1994-08-25 | ISBN 019509204X | PDF | 288 pages | 10.95 MB

Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning Force Microscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.

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